Ready to test all your smart cards

The CT1000 systems are able to test both contact and contactless smartcards, and can also test combined smart cards (integrating both contact and contactless cards in a single IC). 

The CT1000 testers are open and configurable to test any kind of communication protocols used on smart cards, and to be updated for new technologies. The systems can test devices that use the common standard protocols (as ISO 7816, ISO 7813, ISO 14443, ISO 15693, MIFARE™, DESFIRE™, FeliCa™, ISO 11784/85, ISO 18000), and are ready to test also the next generation of smart cards protocols, such as USB, MMC, I2C. 

Besides, the CT1000 systems allowperforming functionality verifications by using customized protocols, completly defined by the device's manufacturer. 

RFID Test

The CT1000 RFID channels can perform, in parallel, extremely accurate and reliable measurements of capacitance and inductance.
Each channel is equipped with a Programmable Logic Unit, to decode in real parallel the communication protocol of the device under test.
The channels are also equipped with DSPs, that permit a full programmability for testing customized protocols. 

UHF Test

The CT1000 series can test UHF devices with a 800Mhz - 1 GHz frequency.
As well as the RFID channels, the UHF channels are equipped with a Programmable Logic Units and DSPs.

No compromise - Short test time for ultra accurate measurement

The CT1000 series analog instrumentation allows you to reduce the test time and perform extremely accurate measurements. 
The DVM units are capable of data treatment and mathematical calculations on the acquired values. This ensures accurate measurements with no compromise in the data exchange either for single site or multi-site parallel measurements. 

Multisite Parallel Test

The CT1000 testers perform high-parallel test at low cost: each CT module can test 32 synchronous or asynchronous devices in parallel.

Moreover, the CT1000 testers have been designed to be connected in parallel, in order to test more than 32 sites.

Open/Short/Leakage preliminary tests

In order to guarantee the reliability, consistency and reproducibility of the results, the CT1000 can perform preliminary tests such as open, short and leakage test, and verify if the contact is done correctly. 

Capacitance/Inductance measurement

The CT1000 systems can perform the accurate capacitance/inductance measurement, verifying the smart card input signal when the RFID pad is contacted. In this way, it is possible to test the correct working of the device before assembling, detecting faults not identifiable at the final test. 

Passive devices test

The CT1000 systems can check the presence of passive devices, such as capacitors, resistors, resonators.

Final test

The CT1000 systems test the smart card communication conditions with the common standard protocols (ISO 18000, ISO 7816, ISO 7813, ISO 14443, ISO 15693, Mifare™, FeliCa™ , ISO 11784/85), and are ready to test also the next generation of smart card protocol, such as USB, MMC, I²C. Besides, also completely customized protocols can be tested.

Working distance test

CT1000 testers can verify the real working distance of contactless RFID devices. This is possible thanks to the ability to generate programmable magnetic fields, simulating different distances between the smart card and the reader/writer.

Signal clearness and strength

CT1000 can measure the retro-modulation depth, to evaluate the clearness and strength/quality of the answer signal provided by the component under test.

The ATOSC2 system software allows you to develop and debug the test programs in a simple way, thanks to the VRAD (Very Rapid Application Development).

The Graphic User Interface and the algorithms used make quick and easy the use of the software functionalities. Test engineers can also program the system at low-level, through intuitive techniques of manual input.

The Automatic Test Program Generation is fast, thanks to structures based on family test libraries.

Software for data collection, processing and analysis 

	Very Rapid Applications Development - Device Data Map Editor - Test Plan Map Editor - Bin Maps - Test Model Libraries - Pattern Data Import from simulator - Automatic Test Program Generation - Documentation and report generation
Software for production - Standard operator control panel - Real time in-line yield monitor - Retest on fail - Statistic production process data analysis - Sampling on the fly - Bin alert - Delta site yield alert
	Software for debugging - Instrument setting change on the fly - Shmoo plot (bi- or tridimensional) - Characterization - Virtual debugger by event view - Vector change on the fly - Acquisition memory display

RFID channels
- Max n. 32
- Frequency: 125 KHz ÷ 15 MHz
- Voltage: ±20 V
- Send/Rechange Commands: 4KB
- Memory per pin depth: On-the-fly reloadable
- Memory pin speed: 66 MHz
- Electromagnetic field sensitivity (according with antenna dimensions): 100 µA

UHF channels 
- Max n.: 32
- Frequency: 800 MHz - 1 GHz
- Send/Rechange Commands: 4KB
- Memory per pin depth: On-the-fly reloadable
- Memory pin speed: 66 MHz

Digital channels 
- Max n.: 128
- Frequency: Up to 100 MHz
- Voltage: -1.5 ÷ +6.5 V
- Resolution: 16 bit

Analog channels 
- Max n.: 192
- Voltage: ± 10 V @ 100 mA
- Resolution: 16 bit