The test cell for smart cards, HF and UHF devices, is composed by the reel-to-reel test handler (H1000 series) and the test system (CT1000 series).
The CT1000 testers are designed to satisfy all test needs of any kind of UHF devices and smart cards (contact, contactless or combined), which utilize standard or customized protocols. Additionally to the standard parametric tests (open, short, leakage), these testers can also perform the ultra-accurate measure of capacitance/inductance on RFID devices (verifying the input signal before assembly), the test of passive devices (e.g. capacitors, resistors, resonators), the final functional test of the communication, the working distance test for RFID devices, and the measure of the signal clearness and strength. The Multi-Site test (up to 32 devices in parallel) allows a high productivity, matching today’s production requirements.
H1000 is a series of modular handlers designed to supply a flexible and cost-effective equipment for the test of devices in reel. They are characterized by the fast set-up conversion time (the change for a different device requires less than five minutes) and high throughput (up to 59.000 UPH).
The complete integration between test equipment and handler provides a turn-key solution in a minimized footprint, while taking advantage of a unique software environment and an optimized communication between the systems.
SPEA Smart Card Test Cell