Analog/Digital ChannelsProgrammable Logic Units TMU
The C372MXS systems can be equipped with up to 512 analog/digital channels and PLU (Programmable Logic Units) per pin, for speeding up the test execution and/or loading dedicated functions in order to satisfy the specific test requirements of the device under test.
The measurements can be performed in parallel on each pin, and asynchronous devices can be tested.
Multiple Digitizers with DSP & Arbitrary Signal Generator
Multiple channel digitizers DSP instrumentation & arbitrary signal generator units can be installed for the multiple signal generation and the analog acquisition for the real parallel test.
Low Power Generators
The C372MXS 4-quadrant V/I Source & Measurement Units force and measure voltage of ±6 V and current of ±200 mA.
Medium Power Generators
The C372MXS 4-quadrant V/I Source & Measurement Units force and measure voltage up to ±120 V and current up to ±2 A.
High Power Generators
The C372MXS systems are able to perform the test of power devices (as MOSFET, IGBT, diodes) in parallel, thanks to the high voltage/power generators that can be equipped.
RF Functions
The C372MXS can be either equipped with one or more RF generator (RF rack integration), or with PXI modules to accomodate RF instruments (PXI based instrument integration).