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the most advanced, most reliable, most convenient - for testing semiconductors and electronic boards.

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 C400MX - SoC & SiP Testers
 Compact tester for Multi-Site Mixed Signal and Power devices

 

 C430MX C430MX - Extended   C430MX - Embedded

 

 Overview back    Minimize

The C430MX offers flexibility and great functionality in a compact test-head cost-effective tester, specifically designed to lower the cost of test for high-runner mixed signal and power devices. 

The C430MX is especially targeted to the wafer and final test of mixed-signal, power devices with digital controllers and high-power automotive applications. 

 Features back    Minimize

Universal Slots

C430MX test head contains 24 universal slots, equippable with a complete set of instrumentation: digitizers, arbitrary waveform generators, counters, analog & digital channels, High voltage pin analog.

The open and scalable system architecture (hardware and software) allows easily modifying and/or integrating the configuration, in order to meet changes in production and new testing needs.

 

High Power generators

The C430MX systems are able to perform the test of power devices (as MOSFET, IGBT, diodes) in parallel, thanks to the huge of high voltage/power generators equippable (up to 12), with up to 2500 V and high current (up to 400 A).

 

Programmable Logic Units

C430MX systems are equippable with up to 192 PLU (Programmable Logic Units), for loading dedicated functions in order to satisfy the specific test requirements of the device to test. 

 

Precision Measurement Units

The C430MX 4-Quadrant Precision Per Pin Measurement Units (PMU) force and measure voltages of ±20 V and currents of ±40 mA. The PMU equippable on the system are up to 16, for a total of 256 indipendent channels

 

Multiple Digitizers & DSP

The up to 16 digitizers equippable on C430MX systems are able to acquire - simoultaneously - up to 64 analog signalswith up to 1 MHz bandwidth and 160 V amplitude. The digitizers are based on DSP processors, for analyzing the acquired data and saving on test time. 

 

Conceived for Space Saving

- Very small footprint 
- Very compact test head 
- Integrated Manipulator

 

RF Functions

The C430MX can be either equipped with one or more RF generator (RF rack integration), or with PXI modules to accomodate RF instruments (PXI based instrument integration). 

 

Software for data collection, processing and analysis 

Very Rapid Applications Development

- Device Data Map Editor
- Test Plan Map Editor
- Bin Maps
- Test Model Libraries
- Pattern Data Import from simulator
- Automatic Test Program Generation
- Documentation and report generation

Software for production

- Standard operator control panel
- Real time in-line yield monitor
- Retest on fail
- Statistic production process data analysis
- Sampling on the fly
- Bin alert
- Delta site yield alert

Software for debugging

- Instrument setting change on the fly
- Shmoo plot (bi- or tridimensional)
- Characterization
- Virtual debugger by event view
- Vector change on the fly
- Acquisition memory display

 

The ATOSC2 system software allows you to develop and debug the test programs in a simple way, thanks to the VRAD (Very Rapid Application Development).

The Graphic User Interface and the algorithms used make quick and easy the use of the software functionalities. Test engineers can also program the system at low-level, through intuitive techniques of manual input.

The Automatic Test Program Generation is fast, thanks to structures based on family test libraries.

 

- Pin count: up to 768 (analog, digital or mixed signal)
- True per pin system architecture
- Multi-Site test capability (synchron and asynchron)
- Up to 16 medium power V/I sources (+/- 120 V; +/- 2 A) 
- Up to 4 high power V/I sources (+/- 100 V; 400 A)
- Up to 8 high voltage V/I sources (+/- 2500 V)
- Multiple Digitizer & DSP for real time data acquisition & processing
- High resolution AC generators (16 bit, 20 bit Audio BW)
- 4-quadrant PMU (Precision Measurement Unit) Per Pin
- PLU (Programmable Logic Unit) Per Pin
- TMU (Timing Measurement Unit) Per Pin
- HPMU High Voltage Pin Analog (+/- 60 V; +/- 100 mA)
- RF generators up to 3 GHz
- PXI based instrumentation

 

  C430MX C430MX - Extended C430MX - Embedded
Slots for Per Pin Instrumentation
Digitizers, AC Sources, Counters, Analog & Digital channels
24 24 24
Slots for Medium Power Generators 8 up to 64 gener.±20V/100 mA or   16 gener. ±120V/2A 16 up to 128 gener. ±20V/100 mA or   16 gener. ±120V/2A 8 up to 64 gener.  ±20V/100 mA or   16 gener. ±120V/2A
Slots for Medium Power & High Voltage generators
single or Multiple section.
4 8 4

 

- Power Devices
- Automotive
- Analog devices
- Power management devices
- Battery chargers
- Lighting and LEDs drivers
- MEMS devices 

 

*The digital channels cover 2 frequence ranges
-Up to 50 MHz
-Up to 200 MHz

 






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