1976

• SPEA was founded by Luciano Bonaria. The company was producing systems for testing electronic boards

1977

• SPEA manufactures the first Polyfunctional Automatic Board Tester

1981

• SPEA GmbH opened near Francoforte. About 40 people work in this branch, being involved in activities such as R&D, technical and specialistic customer support in German and East-European market, etc.

1982

• First Digital ICT Automatic Board Tester

1988

• SPEA made its first attempt to manufacture equipment for testing microchips. These equipment are conceived for URSS semiconductors technology, and the Soviet Union breakdown made them unserviceable

1992

• New SPEA’s branches opened in Israel, France and Great Britain
• SPEA Asia operation

1995

• SPEA was successful in entering in semiconductor testing market, breaking the USA/Japan worldwide monopoly. One of the first applications in this field was testing microchips used in Swatch watches. The first SPEA’s Mixed Signal Semiconductor ATEs was C340MX (128 channels, 20 MHz)
• SPEA was fourth in the worldwide electronic board testers market

1996

• The first SPEA’s system for testing high-density electronic boards by using flying probe technology was born

1998

• C340MX Mixed Signal Semiconductor ATE 128 ch 40 MHz

1999

• SPEA America opened. SPEA is present in the USA with three facilities, in Texas, California, Illinois

2000

• C322MX Mixed Signal Semiconductor ATE 256 ch 40 MHz

2001

• C372MX Mixed Signal Semiconductor ATE 512 ch 40 MHz

2002

• C3320TFT – TFT driver device Test System
• H1000 Series Reel Handler
• 4040 Hi-Line Flying Probe Tester

2003

• H3000 Series P&P Handler
• 4040 Hi-Line Series 5 Flying Probe Tester
• Technologies Replaceable Integrated Modules – TRIM

2004

• H3000 BLU – Burn-In Loader/Unloader
• Power Audio Trim
• 3030 Series – Board Testers

2005

• SAP Test & Automation opened in Singapore

2006

• SPEA China was founded in Shenzhen
• C400MX Series – Compact Testers for Multi-Site Mixed Signal and Power Devices

2007

• 4040 Multimode - Flying Probe Tester
• MTC series – MEMS Test Cells
• 3030 Twin – High-Productivity In-Circuit Test Cell

2008

• C600MX – High Pin Count SoC and SiP Tester
• H3560 – High Throughput Pick & Place handler
• STC series – Smart Card Test Cells

2009

• MEMS Magnetic Sensor Test Cell
• Tri-Temp Option for MEMS Test Cells
• MEMS Pressure Sensor Test Cell

• PMTC series - Power Module Test Cells
• 4020, 4030, 4060 - New flying probe tester range

• 4060 Backplane: flying probe system for backplane test
• Handling modules: bowl feeder and reel sort unit
• SJP opened in Tokyo
• SKR opened in Seoul