Press  
SPEA 4080 Flying Probe Tester at Apex 2017
Tuesday, February 21, 2017
SPEA China games: the power of being a team!
Tuesday, January 10, 2017
4080, a protagonist in Electronica and Matelec
Monday, November 28, 2016
SPEA receives the "Italian Mechatronics Prize"
Thursday, July 14, 2016
Great success for SPEA 4080 at Nepcon China
Thursday, May 12, 2016
SPEA’s success at Semicon China
Tuesday, March 22, 2016
SPEA reveals new high-productivity high-accuracy 8-axes Flying Probe Tester at APEX 2016
Wednesday, March 16, 2016
SPEA to exhibit its latest Automatic Test Equipment at Productronica 2015
Monday, November 09, 2015
Luciano Bonaria has been awarded the "2014 Bogianen Prize"
Monday, October 26, 2015
Bosch Automotive selects SPEA as worldwide exclusive board ICT tester and handler supplier till 2022
Wednesday, October 14, 2015
“USA Hi-Tech, the new China is in Volpiano: increase in orders for #SPEA” from “Il Sole 24 ore
Wednesday, September 30, 2015
SPEA launches new mixed signal test platform DOT400 at Semicon West 2015
Thursday, June 25, 2015
SPEA exhibits at IPC APEX Expo 2015
Friday, February 13, 2015
SPEA demonstrates the most advanced Flying Probe & Bed-of-Nails testers at Nepcon Japan 2015 fair
Monday, December 22, 2014
SPEA opens new Subsidiary in Suzhou, China
Wednesday, December 17, 2014
mCube selects SPEA test cells for testing inertial MEMS sensors
Wednesday, December 03, 2014
SPEA awarded with the 10th “Premio Nazionale Orientagiovani”
Wednesday, November 19, 2014
SPEA demonstrates the most advanced Flying Probe & Bed-of-Nails testers at Electronica 2014 Fair
Friday, October 24, 2014
SPEA at "Orientagiovani 2014"
Saturday, October 18, 2014
Marco Gilli, Rector of Polytechnic University of Turin, visited SPEA
Monday, September 15, 2014
SPEA AWARD, second edition: a complete success
Friday, June 27, 2014
SPEA hits New-Tech Exhibition 2014 in Tel Aviv
Tuesday, June 17, 2014
Engent Expands Testing Capabilities with SPEA 4060
Tuesday, May 13, 2014
SPEA introduces the new Flying Probe & Bed-of-Nails testers S2. Designed to cut the cost of test
Saturday, April 19, 2014
SPEA hits IPC APEX Expo 2014
Thursday, April 10, 2014
SPEA’s successful SEMICON CHINA 2014
Monday, March 31, 2014
SPEA hits NEPCON JAPAN 2014
Thursday, February 06, 2014
SPEA introduces the new Flying Probe & Bed-of-Nails testers S2. Designed to cut the cost of test.
Monday, February 03, 2014
LED Test with SPEA Flying Probe Tester
Tuesday, November 19, 2013
SPEA will present its new Flying Probe & Bed-of-Nails testers S2 at PRODUCTRONICA Trade Fair 2013
Thursday, October 31, 2013
Sticky Board Test with SPEA Flying Probe Tester
Thursday, October 10, 2013
SPEA shows SEMICON TAIWAN 2013 visitors how to test their semiconductor and MEMS production
Tuesday, August 13, 2013
SPEA and National Research Council (CNR) cooperate in the first European automatic Pilot Plant aimed
Tuesday, July 23, 2013
SPEA exhibits at Semicon West 2013
Wednesday, July 03, 2013
SPEA installs 4060 Flying Probe at MJS Designs
Friday, June 28, 2013
Tunisia’s MED Industrie Fair 2013 was a success
Friday, June 21, 2013
SPEA visits STMicroelectronics plant in Malta
Tuesday, June 11, 2013
SPEA exhibits at Med Industrie 2013
Friday, June 07, 2013
SPEA exhibits at SwissT Fair 2013
Monday, May 20, 2013
SPEA celebrates the 10th 3030 Bed of Nails tester installed in SIEMENS Switzerland
Monday, April 22, 2013
OSTEC and SPEA at ElectronTechExpo 2013
Monday, April 15, 2013
SPEA exhibits at NEPCON CHINA 2013 - SPEA 产品展览 (Nepcon 中国,2013)
Thursday, April 11, 2013
SPEA and ISE Labs announce partnership for MEMS testing
Friday, April 05, 2013
SPEA exhibits at Semicon China 2013
Monday, March 04, 2013
SPEA hits Semicon Korea 2013
Tuesday, February 19, 2013
Luciano Bonaria professor for one day. Lesson on industrial test at Politecnico in Turin
Thursday, January 17, 2013
SPEA exhibits at Semicon Korea 2013
Wednesday, January 16, 2013
Luciano Bonaria, President & CEO SPEA, talks about SPEA on Italian television.
Wednesday, January 09, 2013
SPEA shows ELECTROTEST JAPAN visitors how to test their production
Wednesday, January 09, 2013
Semicon Japan 2012: definitely good
Friday, December 21, 2012
If your request is checking and improving the production process, QSoft is the answer.
Wednesday, December 12, 2012
Meet SPEA at Semicon Japan 2012
Friday, November 30, 2012
SPEA 3030 Operatorless Test Cell. Maximum competitiveness, maximum savings
Tuesday, November 20, 2012
OSTEC and SPEA at RusNanoTech 2012
Monday, November 05, 2012
SPEA's success at Matelec Trade Show
Wednesday, October 31, 2012
SPEA C430MX hits Semicon Taiwan 2012
Wednesday, October 03, 2012
Visit SPEA at Nepcon South China 2012
Thursday, August 09, 2012
Outstanding success at Semicon West 2012
Tuesday, July 24, 2012
SPEA Award 2013: rewarding excellence in technical education
Monday, July 16, 2012
SPEA at Semicon West: A Focus On Test Solutions For Power Devices, LED Drivers, Power Management ICs
Friday, June 15, 2012
SPEA Students' Cup: find the talent to grow in Italy
Thursday, May 31, 2012
OSTEC and SPEA at ElectronTechExpo 2012
Sunday, April 15, 2012
SPEA amazes Semicon China visitors
Thursday, April 05, 2012
3030, the Cost-Effective Board Tester: Over 500 Systems Sold
Tuesday, April 03, 2012
SPEA MX Freestyle World Championship: here’s the show!
Wednesday, March 14, 2012
SPEA at Semicon China
Tuesday, February 14, 2012
Great result for SPEA at Electrotest Japan
Wednesday, February 08, 2012
SPEA Establishes Direct Entity in Korea
Tuesday, January 10, 2012
SPEA presents the all-new 4030 at IPC APEX Expo 2012
Monday, January 09, 2012
SPEA MX Freestyle World Championship
Thursday, January 05, 2012
Great success for SPEA at Semicon Japan!
Wednesday, December 14, 2011
SPEA hits Productronica!
Monday, November 28, 2011
SPEA 4060 wins the seventh annual Global Technology Award
Wednesday, November 23, 2011
SPEA’s Mixed Signal Test Platform at Semicon Japan
Monday, November 14, 2011
SPEA at Productronica 2011, exhibiting the latest in flying probe and bed-of-nails test technology
Friday, October 21, 2011
SPEA announces Tera Probe has placed multiple orders of C430MX testers
Friday, October 21, 2011
Visit us at SMTA International in Fort Worth!
Thursday, October 06, 2011
SPEA at Semicon Taiwan
Monday, September 19, 2011
Great success for SPEA at Semicon West!
Thursday, July 28, 2011
Datest integrates the SPEA 4060 with GOEPEL/JTAG Boundary Scan Technology
Wednesday, July 27, 2011
SPEA's Mixed Signal Test Platform at Semicon West
Friday, June 24, 2011
GOEPEL electronic and SPEA cooperate to integrate Boundary Scan into new Flying Prober Generation
Tuesday, May 10, 2011
SPEA 4060 flying prober wins 2011 New Product Introduction Award
Thursday, April 28, 2011
Kionix's Production Speed Advances Fivefold with SPEA Robotic Test Systems
Wednesday, March 23, 2011
Quake in Japan: status of supply chain
Friday, March 18, 2011
SPEA at APEX 2011, with new flying probe test platform
Friday, March 18, 2011
SPEA opens in Japan
Tuesday, February 15, 2011
SPEA’s Mixed Signal Test Platform at Semicon Japan
Friday, November 26, 2010
Lowering cost of RFID testing with integrated test cells
Friday, October 08, 2010
SPEA donates Comptest MX system to the University of Texas
Thursday, October 07, 2010
SPEA was at IPC Electronics Midwest
Friday, October 01, 2010
MEMS testing: innovations in mass production
Thursday, August 12, 2010
Datest Corp. Adds SPEA 4060 Flying Probe System to Its Repertoire
Wednesday, August 04, 2010
SPEA comprehensive range of test solutions for power semiconductors introduced at Semicon West
Friday, June 25, 2010
SPEA joins in ST Microelectronics’ MEMS success
Friday, June 04, 2010
Highest test coverage with the lowest cost of test
Friday, June 04, 2010
Representatives of SPEA visit Kaisheng in Zibo Representatives of SPEA visit Kaisheng in Zibo
Monday, March 22, 2010
SPEA at APEX 2010, Introducing Innovative Flying Probe to Replace Bed-of-nails In Production Test
Monday, March 22, 2010
4040 Multimode chosen by leading EMS provider NBS
Monday, December 21, 2009
SPEA introduced innovative flying probe at Productronica SPEA introduced innovative flying probe at Productronica
Monday, December 21, 2009
Luciano Bonaria presents SPEA’s integrated test cell concept Luciano Bonaria presents SPEA’s integrated test cell concept
Tuesday, October 27, 2009
SPEA at Cartes 2009, Demonstrating Automated Test Cell for Smart Cards, HF, UHF devices
Tuesday, October 06, 2009
SPEA at Semicon Europa 2009, Demonstrating Rate Tables For MEMS Parametric/Functional Test With True Physical Stimulus
Monday, October 05, 2009
SPEA integrated MEMS test cells presented at Semicon Taiwan
Thursday, September 10, 2009
SPEA and Premtek partner to jointly market and support semiconductor test equipment and solutions in Taiwan
Friday, August 07, 2009
Integrated MEMS Test Cells Provide High-Throughput Full Final Test
Monday, July 06, 2009
SPEA complete MEMS automated test cell introduced at Semicon West
Tuesday, May 26, 2009
Success for SPEA at APEX 2009 in Las Vegas
Tuesday, April 14, 2009
SPEA confirms its sponsorship for the FIM Trial World Championships
Wednesday, March 18, 2009
SPEA at Electronica 2008 in Munich
Tuesday, March 03, 2009
Flying prober for production test
Tuesday, March 03, 2009
Mr. Vetsch new president of SQC
Thursday, October 30, 2008
SPEA introduces the new C600MX SoC & SiP Tester
Monday, September 15, 2008