|
1976
|
- SPEA was founded by Luciano Bonaria. The company was producing systems for testing electronic boards
|
|
1977
|
- SPEA manufactures the first Polyfunctional Automatic Board Tester
|
|
1981
|
- SPEA GmbH was founded near Francoforte. About 40 people work in this branch, being involved in activities such as R&D, technical and specialistic customer support in German and East-European market, etc.
|
|
1982
|
- First Digital ICT Automatic Board Tester
|
|
1988
|
- SPEA made its first attempt to manufacture equipment for testing microchips. These equipment are conceived for URSS semiconductors technology, and the Soviet Union breakdown made them unserviceable
|
|
1992
|
- New SPEA’s branches opened in Israel, France and Great Britain
- SPEA Asia operation
|
|
1995
|
- SPEA was successful in entering in semiconductor testing market, breaking the USA/Japan worldwide monopoly. One of the first applications in this field was testing microchips used in Swatch watches. The first SPEA’s Mixed Signal Semiconductor ATEs was C340MX (128 channels, 20 MHz)
- SPEA was fourth in the worldwide electronic board testers market
|
|
1996
|
- The first SPEA’s system for testing high-density electronic boards by using flying probe technology was born
|
|
1998
|
- C340MX Mixed Signal Semiconductor ATE 128 ch 40 MHz
|
|
1999
|
- SPEA America was founded. SPEA is present in the USA with three facilities, in Texas, California, Illinois
|
|
2000
|
- C322MX Mixed Signal Semiconductor ATE 256 ch 40 MHz
|
|
2001
|
- C372MX Mixed Signal Semiconductor ATE 512 ch 40 MHz
|
|
2002
|
- C3320TFT – TFT driver device Test System
- H1000 Series Reel Handler
- 4040 Hi-Line Flying Probe Tester
|
|
2003
|
- H3000 Series P&P Handler
- 4040 Hi-Line Series 5 Flying Probe Tester
- Technologies Replaceable Integrated Modules – TRIM
|
|
2004
|
- H3000 BLU – Burn-In Loader/Unloader
- Power Audio Trim
- 3030 Series – Board Testers
|
|
2005
|
- SPEA Asia Pacific was founded in Singapore
|
|
2006
|
- SPEA China was founded in Shenzhen
- C400MX Series – Compact Testers for Multi-Site Mixed Signal and Power Devices
|
|
2007
|
- 4040 Multimode - Flying Probe Tester
- MTC series – MEMS Test Cells
- 3030 Twin – High-Productivity In-Circuit Test Cell
|
|
2008
|
- C600MX – High Pin Count SoC and SiP Tester
- H3560 – High Throughput Pick & Place handler
- STC series – Smart Card Test Cells
|
|
2009
|
- MEMS Magnetic Sensor Test Cell
- Tri-Temp Option for MEMS Test Cells
- MEMS Pressure Sensor Test Cell
- Tire Pressure Monitoring System MEMS Test Cell
|