The new SPEA CT1000 series is designed to satisfy all test needs of any kind of smart card modules (contact, contactless and dual interface) and RFID devices, which utilize standard or customized protocols. These highly configurable and scalable systems can quickly perform all the measurements to satisfy both parametric and functional test requirements of all currently available and future devices. A single platform for the full test coverage.

- ISO 18000
- ISO 7816
- ISO 7813
- ISO 14443 A/B
- ISO 15693
- Hitag™
- ICode™
- MIFARE™
- DESFIRE™
- FeliCa™
- EPC Global Gen 2
- ISO 11784/85
- USB-Keys
- MMC
- Micro-SD
- M-SIM
- HD-SIM
- SIM-WAVE
- I2C
- Custom

- Contact/contactless/combined smart card test
- Standard & customized protocols
- Programmable Logic Units per channel
- HF test 125KHz-15MHz
- UHF test 800 MHz-1 GHz 
- Short test time for ultra accurate measurement
- Up to 80 synchronous or asynchronous devices in parallel
- Open/short/leakage preliminary test
- Capacitance/inductance measurement
- Passive device test
- Final test
- Working distance test with Antenna
- Signal clearness and strength test
- Windows based programming software

- Input Capacitance Test
- Input Inductance Test
- Open/Short/Leakage Test
- Passive Device Test
- Wafer Test
- Working Distance
- LF/HF Test
- UHF Test