You are here:   Semiconductor Test > Products by Function > CT1000

Smart Card - HF - UHF Testers
High Multi-Site Testers for CPU, memory, RFID, UHF Devices



 Up to 80 devices tested in parallel
Contact, contactless and combi devices
SAM support for crypto devices
Parametric and functional test
Smart card device family suite editor




Ready to test all your smart card modules

The CT1000 systems are able to test both contact and contactless smart cards, and can also test dual interface devices (integrating both contact and contactless card chips in a single module).

The CT1000 testers are open and configurable to test any kind of communication protocols used on smart cards, and to be updated for new technologies. The systems can test devices that use common standard protocols (as ISO 18000, EPC Global Gen 2, ISO 14443, ISO 15693, MIFARE™, DESFIRE™, FeliCa™, ISO 11784/85, ICode™, Hitag™, ISO 7816, ISO 7813), and are ready to test also the next generation of cards protocols, such as: USB-Keys, MMC, Micro-SD (with and without CPU inside), M-SIM, HD-SIM, SIM-WAVE, and I2C.

Additionally, the CT1000 systems allow the performance of functionality verifications by using customized protocols, completely defined by the device manufacturer.





Devices - Application Field



Test Capabilities


Open/Short/Leakage preliminary tests

In order to guarantee the reliability, consistency and reproducibility of the results, the CT1000 can perform preliminary tests such as open, short and leakage test, and verify if the contact is done correctly. 


RFID device test with antenna

CT1000 testers can verify the real working of contactless RFID devices. The systems is equipped with antenna to read data from and write data to an RFID tag via radio, generating programmable magnetic fields.


Capacitance/Inductance measurement

The CT1000 systems can perform the accurate capacitance/inductance measurement, verifying the smart card module communication signals when the RFID pads are contacted. In this way, it is possible to test the correct working of the device before assembling into cards, detecting faults not identifiable at the final test. 


Signal clearness and strength

CT1000 can measure the retro modulation index, to evaluate the clearness and strength/quality of the answer signal provided by the component under test.


Test of passive devices

The CT1000 systems can check the presence of passive devices, such as capacitors, resistors, resonators.


Final test

The CT1000 systems test the smart card communication conditions with the common standard protocols (ISO 18000, EPC Global Gen 2, ISO 14443, ISO 15693, MIFARE™, DESFIRE™, FeliCa™, ISO 11784/85, ICode™, Hitag™, ISO 7816, ISO 7813), and are ready to test also the next generation of smart card protocols, such as USB-Keys, MMC, Micro-SD (with or without CPU inside), M-SIM, HD-SIM, SIM-WAVE and I2C. Besides, also completely customized protocols can be tested.













The CT1000 RFID channels can perform, in parallel, extremely accurate and reliable measurements of capacitance and retro modulation index. The channels perform the real time encoding and decoding of the communication protocol for the device under test.

Each channel is also equipped with a Programmable Logic Unit, to decode in true parallel the communication protocol of the device under test, thus performing complete functional testing of the internal module structure. The channels are also equipped with DSPs, that permit a full programmability for testing customized protocols.

LF/HF Test Frequency: 125kHz ÷ 13.56MHz
UHF Test Frequency: 800 MHz ÷ 1 GHz

The CT1000 can be equipped with a SAM interface module, for a state-of-the-art security level during RFID device testing.







Short Test Time
for accurate measurements

The CT1000 series latest-technology analog
instrumentation allows for the reduction of the test time, and performs extremely accurate measurements.

The DVM units are capable of data treatment and mathematical calculations on the acquired values.

This ensures accurate measurements with
no compromise in the data exchange either for single site or multi-site parallel measurements.













parallel test

The CT1000 testers perform high-parallel test at low cost: each CT1000 module can test 32 synchronous or asynchronous devices in parallel.

Moreover, the CT1000 testers have been designed to be connected in parallel, in order to test more than 32 sites.

When the CT1000 testers are used for the final test,  they can be connected to the SPEA H1000 reel-to-reel handler.











Test Program generation and debug <1 day

- Easy-to-learn programming environment
- Guided Test Program generation
- The Automatic code generation
  dramatically shortens the time taken to
  develop, debug and release the program
- Automatic data import
- DUT-Oriented & Instrument-Oriented
  instruction Libraries
- DUT Map
- Very Rapid Appllication Development
- Test Result Analyzer
- Shmoo Plot
- Easy to run. Easy to monitor.
  Easy to mantain.