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Semiconductor IC Testers
for engineering, wafer prober and final testing

 

SPEA’s testers help manufacturers of MEMS and discrete devices, stand-alone integrated circuits, Systems-on-a-Chip (SoC), Systems-in-Package (SiP), to deliver top-quality products in the fastest time-to-market, optimizing costs.

SPEA R&D teams always work on future-ready, high-performance test architectures, designed to lower the cost of test, guarantee fast application development, keep low investments and cost of ownership.


  

  Models 

 

 

 

 

 

 

 Analog Mixed
Signal Testers 
 

 

 Technology-Oriented
Testers 
 

 

 MEMS Device-Oriented Tester 

High-performance, best-throughput mixed signal testers, for high pin count devices and high-mix productions

 

 

Zero-footprint, easily
reconfigurable mixed signal testers for automotive, PMICs, lighting, converters, MEMS

 

 

A revolutionary per-device test architecture, for MEMS and other low pin count devices

 

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