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 Comptest MX - Mixed Signal Testers
 The cost-efficient multi-site production test

 SPEA’s Comptest MX is the innovative test platform addressing the test requirements of all mixed signal devices, including complex analog, high-power, MEMS, RFID, and smart card modules.

The Comptest MX has been expressly designed to drive down the cost of test of the devices of 50%, through a high-efficiency architecture, that is complemented by the powerful ATOS C2 operating system.

  

5 reasons to choose SPEA Comptest MX

 

1

• PC-performance independent: multiple SPEA CPUs provide test program timing, while pc replacement does not require the test program requalification
• Pattern-based programming: -30% test time vs. competitors
• 64-line synchrobus and 16-line high-speed synchrobus for real-time instrument synchronization: no embedded delay when running pattern-based testing
• 99% parallel test efficiency
• Multi-site test capabilities for up to 256 devices in parallel
• High-density, floating instruments, for true parallel analog test
• Universal slot architecture, up to 1,408 channels
• RF generators up to 3 GHz
2 • 1 SPEA board takes the place of 4 competitor boards
• Totally floating, independent for sensing/forcing per channel
• Wide V/I range: ±100V / ±1A, ±20V / ±2A, ±20V / 40mA
• 8 DVM digitizers into Readback, totally independent and independently floating
• 8 DVMs available on interface to measure on different points from the sourcing ones
• Clamp alarms, spike detector, automatic ramp generators 
3 • Test time for timing measurement is 1/8 than competitors for digital data calculation and protocol management
• 200 MHz frequency
• 16 M Pattern memory
• Voltage range -2 to +6.5V or -2 to 14V
• Active load integrated in the digital pin
• Integrated DPS (-2 to +24V, ±500mA)
• 8 integrated Timing Measurement Units (with possibility of multiple time measurements on the same channel)
• Integrated Programmable Logic Units
4 • Octal Digitizer & DSP for real time data acquisition & processing: 16 bit HF, 24 bit Audio BW
• Quad AC generators: 14 bit HF, 20 bit Audio BW
• Selectable low pass analog filters
• Integrated DSPs for fast signal processing
• Waveform generator with high-accuracy audio section and possibility to generate custom waveforms
• Counter, for time measurements on high-voltage signals (±100V) and non-periodic signals - one-shot timing measurements
5

 

• 8 high current sources: 1000 A pulsed or 20 A continuous
• 8 high voltage sources: ±2500 V
• Insulation guaranteed at test head interface (instruments housed in the instrument cabinet)
• High-voltage and high-current generators designed by SPEA
• Embedded CPUs for safety control and fast programming
• Clamp alarms, spike detector, automatic ramp generators

 

Complete, ready-to-use system
 

     ATOS C2 for more information... 

 

Comptest MX Models

 




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