SPEA showcases Automatic LED Light Tester at Productronica 2023

SPEA's Led Light Tester at Productronica 2023

SPEA T100L Automatic LED Light Tester among the leading-edge test equipment displayed at Productronica 2023

SPEA, global leading manufacturer of automatic test equipment for electronics and semiconductors, will present the unique SPEA-branded T100L Automatic LED Light Tester alongside the most pioneering engineering for testing electronic products.

Productronica is the largest international event for the electronics production industry. It combines all elements of the innovative development and production of electronics and is the most important platform for innovations and world premieres.

In such a setting, SPEA will be showcasing a wide range of automatic test equipment for electronic boards, LED light panels, and power semiconductor devices at A1 Hall – Booth #255 of the imminent trade fair.

SPEA T100L – Pixel-by-pixel measurement of the most advanced LED device technologies

The SPEA’s T100L tester sets a new milestone in testing LED lighting products. The T100L is a fully automatic Flying Scanner LED Light Tester that helps manufacturers ensure the highest quality of their lighting devices in high-volume production.

Thanks to its unique Flying Light Scanner, the system can acquire a light image of the device surface by scanning all the LEDs in parallel.

All the tests run in real-time, which means that the tester can process and analyze the light characteristics of each LED simultaneously.

SPEA T300 – In-circuit tester capable to test and flash in parallel up to 32 PCBAs.

The SPEA’s T300 Board Tester is an unprecedented and unique architecture board test system that embeds multi-tester and multi-core capabilities in one compact, fully automatic test machine.

The T300 features 8 embedded testers, fully independent and configurable to maximize throughput and test parallelism. It supports up to 32 parallel In-Circuit Test Cores and 256 Flashing/Digital Test Cores, plus eight additional Asynchronous Flashing/Functional Test Cores.

Thanks to these unique features, the system can test and flash in parallel up to 32 PCBAs or a high number of sections of a single large board. That means a substantial reduction of testing time and cost.

SPEA 4080 – The fastest flying probe tester for electronic board testing

The 4080 is conceived for the most demanding electronics manufacturers to cut the cost of test thanks to its high throughput and test capabilities.

It can mount 28 different flying tools, chosen among over 50 ones, to combine electrical test, optical inspection, thermal test, 3D scan, and many more.

The double-sided high-speed moving axes, micro-probing accuracy, multidisciplinary test capability, and flexible scalability allow electronics manufacturers to ensure zero-failure escape in a wide range of applications at the highest throughput.

Coupled with the compact SPEA ALM automatic board handling module, loading and unloading procedures are secure, consistent and fast. The ALM Module simplifies operations by programming

test sequences from a wide choice of pass-through and pass-back modes, ensuring production continuity and accuracy.

SPEA 3030IL- In-Circuit Tester for high-volume production

SPEA 3030IL is the fully automatic bed-of-nails tester expressly designed to minimize the cost of test and provide unparalleled throughput without requiring the operator to load the PCB or launch the test. It can be equipped with up to four independent test cores able to test in parallel up to four boards/panels of boards.

3030IL is compliant with SMEMA and HERMES standards. It can be easily integrated into SMT lines and fully automated productions. It can also work as a single test cell when equipped with SPEA board loading modules.

SPEA DOT800T- Mixed-signal tester for power semiconductor testing

Based on the innovative DOT test platform, the SPEA DOT800T with the power test box PTB200 provides a complete solution for power testing, combining on a single machine all the resources to perform ISO, AC, DC test on the whole range of power applications.

This tester is expressly designed to address the test requirements of traditional Silicon devices as well as new Gallium Nitride and Silicon Carbide technologies, covering their performance range with the highest voltage and current source capabilities, high frequency and low current measurement capabilities.

A multi-core architecture allows DOT800T to perform accurate static, dynamic and isolation tests on dedicated stations, each of which with a dedicated independent controller.

The different test programs are performed in a true parallel, asynchronous mode, since each test core controller manages test resources, instrument connections, and test program execution.

Meet our experts at Hall A1- Booth #255 on November 14-17, 2023 to find out more about how to test your electronic and semiconductor products and predict any future failure.

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