In-Circuit Testers
SPEA's ICT Testers Provide Shorter Test Time, Extended Test Coverage and Full Scalability
Download our free guideSPEA’s In-Circuit Testers are scalable In-Circuit Test platforms that deliver the shortest test time, superior diagnostic accuracy, and extended test coverage for the most comprehensive range of electronic products.
SPEA’s Bed of Nails Board Testers are designed to increase yield, shorten the testing time, and cut the cost-of-test. Thanks to their unique Multi-Tester and Multi-Core Architecture, the SPEA’s In-Circuit Testers provide up to ten times greater throughput than conventional ICT test systems.
Detect any defects at the highest throughput with SPEA ICT Tester
SPEA’s in-circuit tester ensure zero-failure escape and can reliably and consistently test a wide range of electronic boards for automotive, energy, medical, aerospace, lighting, and internet of things (IoT) applications.
Automatic and manual board handling, high throughput, consistent and repeatable results, full scalability, on-field upgradeability – these exclusive features allow SPEA’s ICT testers to meet the testing and throughput needs of electronics manufacturers, with reliable and flexible test equipment for long-lasting and intensive use over the years.
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Download Our In-Circuit Testing Brochure
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Benefits of Automatic In-Circuit Testing
Our expertise ensures that manufacturers’ key requirements are consistently met. Find out more about the benefits of automatic In-Circuit testing.
Cost-Efficiency
The testers’ flexibility and their ability to run complete tests make them the ideal asset.
Throughput
The multi-core architecture provides up to 8x greater throughput compared to standard ICT testers.
Full Test Coverage
By executing a complete range of test techniques, field returns are practically eliminated.
Flexibility
SPEA automatic in-circuit testers are fully configurables and upgradable.
Cost-Efficiency
The testers’ flexibility and their ability to run complete tests make them the ideal asset.
Throughput
The multi-core architecture provides up to 8x greater throughput compared to standard ICT testers.
Full Test Coverage
By executing a complete range of test techniques, field returns are practically eliminated.
Flexibility
SPEA automatic in-circuit testers are fully configurables and upgradable.
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