3030IL can be equipped with up to 4 independent test cores – each one with independent CPU, local memory and instrumentation – able to test in parallel up to 4 boards/panels of boards. Compared to standard ICT testers, 3030IL throughput is up to 400% higher, thus minimizing the cost of test.

3030IL is equipped with a re-designed handling module, which halves the handling time compared to the previous generation. Just 3 seconds are enough for handling a medium-size PCBA, including board loading, presser down, presser up and board unloading.

3030IL is fully compatible with 3030 manual systems. You can migrate production from in-line to manual tester and vice versa, without changing fixture and test program. You can also make the system available for other applications during debug and board repair operations, increasing the system usage.

With the Multi-Stage option, 3030IL delivers different test techniques concurrently (e.g.: In-Circuit + Functional, In Circuit + Flashing, etc.), optimizing the tests among the two stages and further reducing the time and costs.

3030IL does not need an operator to load/unload the board and to perform the test. The system works in a fully automated way – when integrated into SMEMA production line or with standard loaders/unloaders – increasing throughput and dramatically lowering the cost of test.

Compared to standard ATE, 3030IL test speed is significantly higher. Dedicated CPU on each Core guarantees no delay between instrumentation and PC. High-performance relays provide fast switching time. The system’s architecture minimizes instruments setup time during test. The possibility to execute different measurements simultaneously further reduces the test time.

Tester and receiver are fully integrated, both designed by SPEA to provide a reliable cost-effective turnkey test equipment. Board contacting is safe and precise: with the motorized receiver it is possible to program the presser speed according to the UUT characteristics. The descent is always planar, and it is also possible to program different contacting quotes, so to execute different tests on different areas of the UUT. Direct cable-less connection between system instrumentation and fixture guarantees signal integrity. Finally, there is no need for compressed air: 3030IL can be easily moved.

3030IL can be equipped with one or more 4-Core flashing modules, able to program in parallel different-type components. They enable to program specific functions, as well as to load the system software on the ICs during the test, so to cut flashing time and cost.

3030IL‘s high-speed ICT parametric test is able to measure each single component value in a very short time. Advantages: programming time reduction (the test is automatically generated), test time reduction (microseconds of ICT vs. milliseconds of FCT), repairing time reduction (automatic fault device identification).

3030IL can be factory-equipped or upgraded on field with all kind of instrumentation needed to satisfy the test requirements. It is possible to integrate power instrumentation (as AC/DC generators, Active Loads, Power Matrix, etc.) as well as third party instruments to increase test capabilities and productivity.

With 3030’s PC-independent architecture the test program is resident in the tester CPU and the test speed is determined by the system CPU. Antivirus and other applications running on the PC do not affect the test speed. Moreover, you can change/update the PC at any moment, without having to re-debug the test program.