High throughput. High scalability.
Full test coverage

3030M

MULTI-CORE MULTI-FUNCTION BOARD TESTER

Multifunction test capabilities:
100% coverage with 1 system

3030M is the multi-function, fully upgradable and customizable ICT tester, expressly designed to combine full test coverage and the lowest cost of test into a unique manual test equipment. Modular and configurable with a wide range of instrumentation and receivers, 3030M provides 4x throughput compared with standard testers.

SAVE MONEY – Why buy several testers when you just need one? By using 3030M, multiple test techniques are executed within a unique system. Compared to multiple test stations, benefits are huge: no operator, a single test program, reduced industrial space, faster training and lower operational costs.

SAVE TIME – Test time is greatly reduced by 3030M. First of all, expensive and unnecessary handling operations are avoided. With just one board loading/unloading the tester executes different tests in a optimized way, in order to avoid redundancy and over-test of your product, thus allowing you to save precious time. And what about programming multiple devices? With 3030M and Leonardo OS you just need a few minutes to generate your multi-function test program.

SAVE FIELD RETURNS – 3030M has been designed to help electronics manufacturers to boost their product quality. By executing various test techniques with the same tester used for ICT, all risks related to subsequent handling operations are avoided. At the end of the test the product is ready to be delivered to the final customer.

Test Capabilities

• Boundary Scan: test inaccessible parts
  The Boundary Scan technique is able to test non-accessible nets and components. The simultaneous use of Boundary Scan technique with SPEA 3030M ICT instrumentation allows to increase the test coverage reducing at the same time the fixture costs (virtual test points instead of real test nails).
• Open Pin detection
  Two different test techniques, Electro Scan and Junction Scan, can be executed for detecting open pins and other process defects in an easy and fast way.
• Functional test
  3030M testers provide not only functional test (FCT) at board level but also at cluster level. Programming is easy with Leonardo OS and by means of high level languages such as Microsoft C ++, Visual Basic, LabView.
  
• Cost-effective Per-Pin Architecture
  Each 3030M channel is configurable by test program. Every nail can be used to perform any kind of test. This instrument/receiver 1:1 ratio guarantees several benefits: faster test generation, easy ECO management, full flexibility.
• Hi-speed parametric ICT
  3030M hi-speed ICT parametric test is able to measure each single component value in a very short time. Advantages: programming time reduction (the test is automatically generated), test time reduction (microseconds of ICT test vs. milliseconds of FCT), repairing time reduction (automatic fault device identification).
  
• Fixture & Test Program migration
  SPEA Common Architecture allows Leonardo OS test programs to work with all SPEA board test systems, 3030 and even Flying Probers. You can quickly move your production from one system to another, depending on the production needs.