High throughput. High scalability.
Full test coverage






Key Features


  • -75% test cost with True Parallel Test
  • Multifunction: full test coverage
  • Fully customizable & upgradable
  • Equippable with power instrumentation
  • Automatic test program generation
  • Parallel programming of different-type ICs

Multifunction test capabilities:
100% coverage with 1 system


3030M is the multi-function, fully upgradable and customizable ICT tester, expressly designed to combine full test coverage and the lowest cost of test into a unique manual test equipment. Modular and configurable with a wide range of instrumentation and receivers, 3030M provides 4x throughput compared with standard testers.


SAVE MONEY – Why buy several testers when you just need one? By using 3030M, multiple test techniques are executed within a unique system. Compared to multiple test stations, benefits are huge: no operator, a single test program, reduced industrial space, faster training and lower operational costs.

SAVE TIME – Test time is greatly reduced by 3030M. First of all, expensive and unnecessary handling operations are avoided. With just one board loading/unloading the tester executes different tests in a optimized way, in order to avoid redundancy and over-test of your product, thus allowing you to save precious time. And what about programming multiple devices? With 3030M and Leonardo OS you just need a few minutes to generate your multi-function test program.

SAVE FIELD RETURNS – 3030M has been designed to help electronics manufacturers to boost their product quality. By executing various test techniques with the same tester used for ICT, all risks related to subsequent handling operations are avoided. At the end of the test the product is ready to be delivered to the final customer.

4 Test Cores. True Parallel Test

3030M can be equipped with up to 4 independent Cores – each one with independent CPU, local memory and instrumentation – able to test in parallel up to 4 boards/panels of boards. This provides up to 75% of test cost reduction, compared to standard ICT testers. Just one system, one operator, one handling, one fixture and one PC to test 4 PCBAs simultaneously.

Multi-device Parallel Flashing

3030M can be equipped with one or more 4-Core flashing modules, able to program in parallel different-type components. Flashing enables to program specific functions (BIST or BOST), as well as to load the system software on the ICs during the test stage, thus cutting the programming time and cost.

PC-independent Architecture

With SPEA 3030 PC-independent Architecture the test program is resident in the tester CPU and the test speed is determined by the system CPU. Antivirus and other applications running on the PC do not affect the test speed. Moreover you can change/update the PC at any moment, without having to re-debug the test program.

Fully upgradable & customizable

3030M can be factory-equipped or upgraded on field with all kind of instrumentation useful to satisfy the test requirements. It is possible to integrate power instrumentation (as programmable AC/DC generators, Active Loads, Power Matrix, programmable Power Supplies etc.) as well as third party instruments to increase test capabilities and productivity. Finally, 3030M can accommodate a wide range of fixture receiver models, also from third parties (Genrad, Ingun, Zentel, Augat Pylon…).

Precise contacting with SPEA’s receivers

Tester and receiver are fully integrated, both designed by SPEA to provide a reliable cost-effective turnkey test equipment. Board contacting is safe and precise: when the system is equipped with motorized receivers, it is possible to program the presser speed according to the UUT characteristics. The descent is always planar, and it is also possible to program different contacting levels, so to execute different tests on different areas of the UUT. Direct cable-less connection between system instrumentation and fixture guarantees signal integrity. Finally, there is no need for compressed air: 3030M is easy to be moved everywhere in the plant.

Forget field returns

3030M has been designed to help electronics manufacturers increase their product quality. By executing various test techniques with its high-performance instrumentation and stimuli, 3030M can reliably find faults undetectable by standard ICT testers.

Test Capabilities


  • Boundary Scan: test inaccessible parts
    The Boundary Scan technique is able to test non-accessible nets and components. The simultaneous use of Boundary Scan technique with SPEA 3030M ICT instrumentation allows to increase the test coverage reducing at the same time the fixture costs (virtual test points instead of real test nails).
  • Open Pin detection
    Two different test techniques, Electro Scan and Junction Scan, can be executed for detecting open pins and other process defects in an easy and fast way.
  • Functional test
    3030M testers provide not only functional test (FCT) at board level but also at cluster level. Programming is easy with Leonardo OS and by means of high level languages such as Microsoft C ++, Visual Basic, LabView.
  • Cost-effective Per-Pin Architecture
    Each 3030M channel is configurable by test program. Every nail can be used to perform any kind of test. This instrument/receiver 1:1 ratio guarantees several benefits: faster test generation, easy ECO management, full flexibility.
  • Hi-speed parametric ICT
    3030M hi-speed ICT parametric test is able to measure each single component value in a very short time. Advantages: programming time reduction (the test is automatically generated), test time reduction (microseconds of ICT test vs. milliseconds of FCT), repairing time reduction (automatic fault device identification).
  • Fixture & Test Program migration
    SPEA Common Architecture
    allows Leonardo OS test programs to work with all SPEA board test systems, 3030 and even Flying Probers. You can quickly move your production from one system to another, depending on the production needs.

Leonardo. Easy. Fast. Self-programming


  • Automatic test program generation in minutes
  • Automatic debug & tuning
  • Minimized application development costs: automatic generation of the file for fixture drilling and wiring
  • Automatic CAD data recognition & import
  • Automatic test report generation
  • User-friendly intuitive graphical interface
  • Real time production monitoring and analysis

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