ID device
final tester

CPU, memory, RFID, UHF Devices

Key features


  • Up to 80 devices tested in parallel
  • For Contact, contactless, dual interface, UHF
  • SAM support for crypto contactless devices
  • Parametric and functional test
  • Smart card device family suite editor

Ready to test all your smart card modules


CT1000 systems are able to test both contact and contactless smart card modules, and can also test dual interface devices (integrating both contact and contactless card chips in a single


CT1000 testers are open and configurable to test any kind of communication protocols used on smart card modules, and to be updated for new technologies. The systems can test devices that use the common standard protocols (as ISO 18000, EPC Global Gen 2, ISO 14443, ISO 15693, MIFARE™, DESFIRE™, FeliCa™, ISO 11784/85, ICode™, Hitag™, ISO 7816, ISO 7813),
and are ready to test also the next generation of cards protocols.


Additionally, CT1000 systems allow the performance of functionality verifications by using customized protocols, completely defined by the device manufacturer.


CT1000 RFID channels can perform, in parallel, extremely accurate and reliable measurements of capacitance and retro modulation index.

The channels perform the real time encoding and decoding of the communication protocol for the device under test.

Each channel is also equipped with a Programmable Logic Unit, to decode in true parallel the communication protocol of the device under test, thus performing complete functional testing of the internal module structure. 

Multi-Site Parallel Test

CT1000 testers perform high-parallel test at low cost: each CT1000 module can test 32 synchronous or asynchronous devices in parallel.

Moreover, CT1000 testers have been designed to be connected in parallel, in order to test more than 32 sites.

When used for final test, the testers can be connected to the SPEA H1000 reel-to-reel handlers or third-party handlers. When used for wafer test, they can be connected to the prober via dedicated cables.

Short test time for ultra accurate measurement

CT1000 series latest-technology analog instrumentation combines
test time reduction with extremely accurate measurements.

The DVM units are capable of data treatment and mathematical
calculations on the acquired values. This ensures accurate measurements with no compromise in the data exchange either for single site or multi-site parallel measurements.

Test Capabilities

  • Open/Short/Leakage preliminary tests
  • Capacitance & impedance measurement
  • Device characterization
  • Final test
  • RFID device test with or without antenna
  • Signal clearness and strength

Test program generation & debug <1day


  • Easy to Use & Powerful Software
  • RFID signal shape drawing
  • Signal viewer and data analyzer
  • Smart card test function library
  • Software for debugging
  • Software for production

Contactless devices (LF, HF, UHF, Crypto devices)

Contact Devices (CPU, Memory)

Combi Devices (Contact + Contactless)

Dual Interface & Contact



Design & Code by dsweb.lab