With DOT800T, SPEA provides a complete solution for power testing, combining on a single machine all the resources to perform ISO, AC, DC test on the whole range of power applications
Key Features
- Market leader in mass production AC/DC test
- One test platform for all power applications
- Wide range of test instrumentation
- Lowest parasitic inductance on the market
- ISO + AC + DC Multi-station asynchronous test
- Turnkey solution
One test platform for all power applications
One test platform for all power applications
DOT800T covers the complete test requirements for wafers, discretes (based on Si, SiC or GaN technology), IPMs, DBCs and IGBT modules.
Wide range of test instrumentation
Wide range of test instrumentation
The system is configurable with a complete set of instruments, providing up to 20kV voltage and 10kA current.
Lowest parasitic inductance on the market
Lowest parasitic inductance on the market
Over-voltage is always lower than breakdown.
ISO + AC + DC Multi-Station asynchronous test
ISO + AC + DC Multi-Station asynchronous test
Multi-core architecture allows DOT 800 T to perform ISO test, AC test and DC test on dedicated stations, each of which with dedicated independent controller. The different test programs are performed in parallel, asynchronous way
Turnkey solution
Turnkey solution
SPEA can provide the complete solution: Tester architecture and instrumentation, contacting, software, application. Designed, manufactured, supported and guaranteed directly by SPEA.
One platform for the whole range of power applications
Wafer Test
Discrete Test (Si)
Discrete Test (SiC / GaN)
KGD Test
IPM Test
DBC Test
Module Test
Multi-Core Architecture
DOT800T is a multi-core power tester, which can be equipped with one to three independent and configurable test cores.
Each core has an internal dedicated controller to manage the tester resources, the connection with the linked instruments, and the test program execution.
DEVICES
Single Phase Bridge
Three Phase Bridge
Diode Rectifier
IGBT Module
Power MOSFET
High Voltage IGBT-MOSFET
Low Voltage IGBT-MOSFET
Fast programming + Ease of use and control
ATOS C2 Operating Software provides all the resources for programming, debugging and test execution, featuring best usability with a set of tools for production mode.
TEST PROGRAM GENERATION & DEBUG <1 DAY
- Codeless programming, with specific test model libraries for power devices
- Visual waveform comparison of different device sections
- On-board acquisition memory for V/I monitoring on all modules
- Possibility to edit single parameters included in the test models
- Test flow can change “on the fly”, with no need for test program re-editing
EASE OF USE AND CONTROL
- Customized Operator Interface
- Datalog/Summary in customized format
- Real Time production monitor for binning and yield
Technical Data
| AC Test | DC Test | ||
|---|---|---|---|
| TdOn - Time delay on ON TdOff – Time delay on OFF Trise – Rise time Tfall – Fall time Eon – Energy ON Eoff– Energy OFF Qrr – Reverse recovered charge Erec – Reverse recovery energy ΔI/ΔTOn – On state Current slew rate ΔI/ΔTOFF - Off state Current slew rate ΔV/ΔTOn - On state voltage slew rate ΔV/ΔTOff – Off state voltage slew rate Vrr – Voltage reverse recovery Rgate/Cgate IRM – Peak reverse recovery current Trr – Reverse recovery time IFRM – Repetitive peack forward current Short circuit test | NTC temistor check IGES – Gate Leakage current VGETh – Threshold voltage Rgate Internal gate resistance Cies - Gate – Emitter capacitance Cres - Transconductance Coes – Output capacitance Gate Charge (Qg) VBr – diode Breakdown test ICES – Collector leakage current Rgate/Cgate VF – Forward diode voltage VCESat – Saturation voltage BVDS - Breakdown Voltage Kelvin RDSON Dynamic RDSON Avalanche / UIL |
