DOT800T
Your complete solution
for power testing

 Watch the video

With DOT800T, SPEA provides a complete solution for power testing, combining on a single machine all the resources to perform ISO, AC, DC test on the whole range of power applications

Key Features

 

  • Market leader in mass production AC/DC test
  • One test platform for all power applications
  • Wide range of test instrumentation
  • Lowest parasitic inductance on the market
  • ISO + AC + DC Multi-station asynchronous test
  • Turnkey solution

One test platform for all power applications

DOT800T covers the complete test requirements for wafers, discretes (based on Si, SiC or GaN technology), IPMs, DBCs and IGBT modules.

Wide range of test instrumentation

The system is configurable with a complete set of instruments, providing up to 20kV voltage and 10kA current.

Lowest parasitic inductance on the market

Over-voltage is always lower than breakdown.

ISO + AC + DC Multi-Station asynchronous test

Multi-core architecture allows DOT 800 T to perform ISO test, AC test and DC test on dedicated stations, each of which with dedicated independent controller. The different test programs are performed in parallel, asynchronous way

Turnkey solution

SPEA can provide the complete solution: Tester architecture and instrumentation, contacting, software, application. Designed, manufactured, supported and guaranteed directly by SPEA.

One platform for the whole range of power applications

Wafer Test

Discrete Test (Si)

Discrete Test (SiC / GaN)

KGD Test

IPM Test

DBC Test

Module Test

Power Test Capabilities

 

  • ISO test up to 20kV
  • DC test up to 20kV / 4kA
  • AC test up to 1.5kV / 3kA
  • I Short Circuit test up to 10kA
  • UIL test
  • Built-in-digitizers on test instruments

Short Test Time

 

  • Multi-core multi-station architecture: parallel asynchronous ISO/DC/AC test
  • Local set-up memory for on-module set-up change
  • Embedded macros to generate ramps and triggers on V/I HV HI modules

Reliable Mixed Mode Operation

 

  • System wide hardware synchronization between modules
  • Embedded alarms on high voltage and high current modules (e.g. Over temp, over current, floating, Kelvin,…)

DEVICES

Single Phase Bridge

Three Phase Bridge

Diode Rectifier

IGBT Module

Power MOSFET

High Voltage IGBT-MOSFET

Low Voltage IGBT-MOSFET

Test Program Generation & Debug < 1 day

 

  • Easy-to-learn programming environment
  • Guided Test Program generation
  • The Automatic code generation dramatically shortens the time taken to develop, debug and release the program
  • Automatic data import
  • DUT-Oriented & Instrument-Oriented instruction Libraries
  • DUT Map
  • Very Rapid Application Development
  • Test Result Analyzer
  • Shmoo Plot
  • Easy to run. Easy to monitor. Easy to maintain.

Technical Data

AC TestDC Test
TdOn - Time delay on ON
TdOff – Time delay on OFF
Trise – Rise time
Tfall – Fall time
Eon – Energy ON
Eoff– Energy OFF
Qrr – Reverse recovered charge
Erec – Reverse recovery energy
ΔI/ΔTOn – On state Current slew rate
ΔI/ΔTOFF - Off state Current slew rate
ΔV/ΔTOn - On state voltage slew rate
ΔV/ΔTOff – Off state voltage slew rate
Vrr – Voltage reverse recovery
Rgate/Cgate
IRM – Peak reverse recovery current
Trr – Reverse recovery time
IFRM – Repetitive peack forward current
Short circuit test
NTC temistor check
IGES – Gate Leakage current
VGETh – Threshold voltage
Rgate Internal gate resistance
Cies - Gate – Emitter capacitance
Cres - Transconductance
Coes – Output capacitance
Gate Charge (Qg)
VBr – diode Breakdown test
ICES – Collector leakage current
Rgate/Cgate
VF – Forward diode voltage
VCESat – Saturation voltage
Design & Code by dsweb.lab
Information Request