Identification Device Final Tester
CT1000 ID Device Final Tester
For CPU, memory, RFID, NFC, UHF devices
CT1000 is designed to satisfy all the test requirements of smart card modules (contact, contactless and dual-interface) and RFID devices, which utilize standard or customized protocols. This highly configurable and scalable tester can quickly perform all the measurements to satisfy both parametric and functional test requirements of today’s and tomorrow’s devices. A single platform, for the full test coverage.
Ready to test all your smart card modules
CT1000 systems are able to test both contact and contactless smart card modules, and can also test dual-interface devices (integrating both contact and contactless card chips in a single modules).
CT1000 testers are open and configurable to test any kind of communication protocols used on smart card modules, and to be updated for new technologies.
The systems can test devices that use the common standard protocols (as ISO 18000, EPC Global Gen 2, ISO 14443, ISO 15693, MIFARETM, DESFIRETM, FeliCaTM, ISO 11784/85, ICodeTM, HitagTM, ISO 7816, ISO 7813), and are ready to test also the next generation of cards protocols.
Additionally, CT1000 systems allow the performance of functionality verifications by using customized protocols, completely defined by the device manufacturer.
Short test time for ultra accuracy
CT1000’s latest-technology analog instrumentation combines test time reduction with extremely accurate measurements.
High test parallelism is achieved at low cost: each CT1000 module can test 32 synchronous or asynchronous devices simultaneously. Moreover, CT1000 testers are designed to be connected in parallel, in order to test more than 32 sites.
The DVM units are capable of data treatment and mathematical calculations on the acquired values. This ensures accurate measurements with no compromise in the data exchange either for single site or multi-site parallel measurements.
When used for final test, CT1000 testers can be connected to SPEA’s H1000 reel-to-reel handlers, or to third-party handlers. When used for wafer test, they can be connected to the prober via dedicated cables.
Amazing test capabilities
CT1000’s RFID channels can perform, in parallel, extremely accurate and reliable measurements of capacitance and retro modulation index. The channels perform the real time encoding and decoding of the communication protocol for the device under test.
Each channel is also equipped with a Programmable Logic Unit, to decode in true parallel the communication protocol of the device under test, thus performing complete functional testing of the internal module structure. The channels are also equipped with DSPs, which permits a full programmability for testing customized protocols.
- LF/HF Test Frequency: 125kHz ÷ 13.56MHz
- UHF Test Frequency: 800 MHz ÷ 1 GHz
The CT1000 can be equipped with a SAM interface module, for a state-of-the-art security level during RFID device testing.
Capacitance and impedance measurement
CT1000 systems can perform accurate capacitance and impedance measurements, verifying the smart card module communication signals when the RFID pads are contacted. In this way, it is possible to test the correct working of the device before the card assembly, detecting defects that would not be identified at the final test, but that would inevitably cause malfunctioning during the device use.
RFID device test with or without antenna
CT1000 testers can verify the actual working of contactless RFID devices. The system can equipped with or without antenna to read data from, and write data to, an RFID tag via radio, generating programmable magnetic fields.
Open / Short / Leakage
In order to guarantee the reliability, consistency and reproducibility of the test results, CT1000 can perform preliminary tests such as open, short and leakage test, and verify the contact correctness.
CT1000 systems test the smart card communication conditions with the common standard protocols (ISO 18000, EPC Global Gen 2, ISO 14443, ISO 15693, MIFARETM, DESFIRETM, FeliCaTM, ISO 11784/85, ICodeTM, HitagTM, ISO 7816, ISO 7813). CT1000 can measure the retro modulation index, to evaluate the clearness and strength / quality of the answer signal provided by the component under test.
CT1000 systems can be used to characterize the device parameters, using a dedicated characterization software tool. A functional data analyzer (SCDA Smart Cart Data Analyzer) and a wave shape drawing tool are available.
Easy to use and powerful software
ATOS C2 Smart Card operating system allows the development and debug of the test programs in a simple way, thanks to the VRAD (Very Rapid Application Development) and the AutoDebug functionality.
The Graphic User Interface and the algorithms used make it quick and easy to use the software functionalities. Test engineers can also program the system at low-level, through intuitive techniques of manual input. The Automatic Test Program Generation is very fast, thanks to structures based on family test libraries.