Wafer tester for NFC, CPU, memory, RFID
CT3000 Wafer Tester
Highest pin count in ID devices wafer test
CT3000 is the new wafer test platform solution for identification, security and Near Field Communication devices. This scalable, reconfigurable and flexible tester can match current and future requirements, providing high pin count and dedicated resources per die, to get a short test time and lower the overall cost of test.
Ready to test all your smart card modules
CT3000 testers are open and configurable to test any kind of communication protocols used on smart cards, and to be updated for new technologies.
The systems can test devices based on the common standard protocols (as ISO 18000, EPC Global Gen 2, ISO 14443, ISO 15693, MIFARETM, DESFIRETM, FeliCaTM, ISO 11784/85, ICodeTM, HitagTM, ISO 7816), while they can perform functionality verifications also by using customized protocols, completely defined by the device manufacturer.
Best throughput with highest pin count
CT3000 testers can test up to 416 synchronous or asynchronous devices in parallel, offering the highest pin count in testing RFID devices at wafer level (256 devices in parallel).
Asynchronous dedicated resources per device under test allows for true asynchronous test, with static or dynamic measurement per die.
Short test time for ultra accuracy
CT3000’s latest-technology analog instrumentation combines test time reduction with extremely accurate measurements.
The DVM units are capable of data treatment and mathematical calculations on the acquired values. This ensures accurate measurements with no compromise in the data exchange either for single site or multi-site parallel measurements.
Top test capabilities to guarantee the best performance
CT3000’s RFID channels can perform, in parallel, extremely accurate and reliable measurements of impedance, retro modulation index, FDT time. The channels perform the real time encoding and decoding of the communication protocol for the device under test.
Each channel is also equipped with a Controller, to decode in true parallel the communication protocol of the device under test, thus performing complete functional testing of the internal module structure. The channels are equipped with dedicated CPUs, which permit a full programmability for testing customized protocols. Test Frequency range is 125kHz to 15MHz (LF/HF).
Test of passive devices
CT3000 can check the presence of passive devices, such as capacitors, resistors, resonators.
Open / Short / Leakage
In order to guarantee the reliability, consistency and reproducibility of the test results, CT3000 can perform preliminary tests such as open, short and leakage test, and verify the contact correctness.
CT3000 can perform the accurate input device impedance measurement, before the verification of the smart card module communication signals when the RFID pads are contacted.
In this way, it is possible to test the correct working of the device before assembling into cards, detecting defects that would not be identified at the final test, but that would inevitably cause malfunctioning during the device use.
Signal clearness and strength
CT3000 can measure the retro modulation index, to evaluate the clearness and strength / quality of the answer signal provided by the component under test.
The system is docked to the wafer prober with hinge manipulator, offering a true zero-footprint solution together with the benefit of a direct, cable-less connection between the test resources and the device under test: best signal integrity is always guaranteed.
Easy to use and powerful software
ATOS C2 Smart Card operating system allows the development and debug of the test programs in a simple way, thanks to the VRAD (Very Rapid Application Development) and the AutoDebug functionality.
The Graphic User Interface and the algorithms used make it quick and easy to use the software functionalities. Test engineers can also program the system at low-level, through intuitive techniques of manual input. The Automatic Test Program Generation is very fast, thanks to structures based on family test libraries.