In-Circuit Tester - Bed of Nails Tester - Background - SPEA

32x Ultra-High Parallelism
In-Circuit Tester

T300 Automatic Board Tester


Full Parallel Test


SPEA T300 Board Tester is an unprecedented and unique architecture board test system that supports up to 32 parallel In-Circuit Test cores with additional capability of 256 cores for Flashing and Functional Test. This enables the T300 Asynchronous Parallel Architecture to perform tests and Flash in parallel up to 32 PCBAs (Printed Circuit Board Assemblies).

SPEA T300 bed of nails tester includes SPEA’s unique ICT-Plus test techniques which allow the detection of many defects present in electronics that are not detectable with traditional ICT testing.

32x ICT Cores


Hi-Performance ICT
8x ICT-Plus Cores


Hi-Performance ICT-Plus
256x Flashing Cores


256x FCT Cores


Functional Test
PCBA Panel

Huge number of Test and Flashing in parallel


Most electronic printed circuit boards today are produced in panels composed of a high number of single boards (PCBAs), which in turn contain one or more components that need to be programmed.

The unique and unprecedented SPEA T300 bed of nails tester has been designed precisely to test and program a large number of boards in parallel or a large number of sections of a single big board. This enables high throughput and consequently very-low cost of testing and programming.

Unique on the market 32x parallel board In-Circuit Tester

T300 is unique on the market for its high parallelism: 32 cores for in-circuit testing and 256 cores for Flash programming and/or functional testing and provides 10x times more throughput compared to the previous ICT Testers generation.

Dual Test Site

Programmable as Single or Dual Test Site


T300 can be programmed to operate as a Single Test Site or Dual Test Site.

Single Test Site allows for testing of a single panel of boards for ICT, Flash Programming, and Functional test.

Dual Test Site allows for testing of two panels of boards at the same time for ICT, Flash Programming, and Functional test. In order to double the throughput, the system is capable of performing a Split Test, such as, ICT in site 1 while simultaneously performing Flash Programming and/or Functional test on site 2.

Operatorless Testing


T300 can be configured in several Automatic Operating Modes that do not require the presence of the operator:

  • In-line Input – In-line Output
  • Rack Input – In-line Output [1]
  • In-line Input – Rack Output [1] [2]
  • Rack Input – Rack Output [1] [2]


[1] Robot rack loading as option
[2] Pass-Fail selection as option

In-Circuit Tester connected to the digital ecosystem


T300 can exchange information, notifications and commands with the Industry 4.0 environment and the digital ecosystem.

The tester’s internal sensors monitor the state of the environment, the wearing parts, the moving parts, the pneumatic circuits, the internal and external power supplies in order to:

  • support the predictive maintenance
  • intercept defects that will cause malfunctions
  • estimate the remaining life of components


The T300 is conceived for long-lasting and intensive use in production as well for easy and quick maintenance.

In-Circuit Tester - Software - ATOS - SPEA

ATOS: proprietary Tester Operating System


ATOS Leonardo 4 ICT is the T300 version of the ATOS Operating System developed by SPEA for its testers.

ATOS incudes all the tester operating and programming functions in order to make it independent from the Windows® version and from the configuration and the performance of the system controller PC.

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