The cost-efficient multi-site
production test
C600MX

ANALOG MIXED SIGNAL TESTER
88 slots for PE Signal Processing Unit
& Medium Power Supplies

Key Features

 

  • 88 slots for PE Signal Processing Unit & Medium Power Supplies
  • floating architecture
  • multi-core capability
  • analog pin performance
  • digital pin performance
  • signal processing instruments
  • high-voltage, hi-current instruments

Floating Architecture

  • PC-performance independent: multiple SPEA CPUs provide test program timing, while pc replacement does not require the test program requalification
  • Multi-Core Architecture: possibility to develop and run 2 independent test programs simultaneously, in asynchronous way
  • Pattern-based programming: -30% test time vs competitors
  • 64-line synchrobus and 16-line high-speed synchrobus for real-time instrument synchronization: no embedded delay when running pattern-based testing
  • 99% parallel test efficiency
  • Multi-site test capabilities for up to 256 devices in parallel
  • High-density, floating instruments, for true parallel analog
    test
  • Universal slot architecture, up to 1,408 channels
  • RF generators up to 3 GHz

Analog Pin Performance

  • 1 SPEA board takes the place of 4 competitor boards
  • Totally floating, independent for sensing/forcing per channel
  • Wide V/I range: ±100V / ±1A, ±20V / ±2A, ±20V / 500mA
  • 32 DVM digitizers into Readback, totally independent and independently floating
  • 8 DVMs available on interface to measure on different points from the sourcing ones
  • Clamp alarms, spike detector, automatic ramp generators
  • Arbitrary Waveform Generators and Time Measurement Units per channel

Digital Pin Performance

  • Test time for timing measurement is 1/8 than competitors for digital data calculation and protocol management
  • 200 MHz frequency
  • 16 M Pattern memory
  • Voltage range -2 to +6.5V or -2 to 14V
  • Active load integrated in the digital pin
  • Integrated DPS (-2 to +24V, ±500mA)
  • 8 integrated Timing Measurement Units (with possibility of multiple time measurements on the same channel)
  • Integrated Programmable Logic Units

Signal Processing Instruments

  • Octal Digitizer & DSP for real time data acquisition & processing: 16 bit HF, 24 bit Audio BW
  • Quad AC generators: 14 bit HF, 20 bit Audio BW
  • Selectable low pass analog filters
  • Integrated DSPs for fast signal processing
  • Waveform generator with high-accuracy audio section and possibility to generate custom waveforms
  • Counter, for time measurements on high-voltage signals (±100V)and non-periodic signals – one-shot timing measurements

High Voltage, High Current Instruments

  • 8 high current sources: 1000 A pulsed or 20 A continuous
  • 8 high voltage sources: ±2500 V
  • Insulation guaranteed at test head interface (instruments housed in the instrument cabinet)
  • High-voltage and high-current generators designed by SPEA
  • Embedded CPUs for safety control and fast programming
  • Clamp alarms, spike detector, automatic ramp generators

Migrating to SPEA CMX

 

  • Parallelism: 2x
  • Test time: 1/2
  • Save 50% of handlers and probers

Test Program Generation & Debug < 1 day

 

  • Easy-to-learn programming environment
  • Guided Test Program generation
  • The Automatic code generation dramatically shortens the time taken to develop, debug and release the program
  • Automatic data import
  • DUT-Oriented & Instrument-Oriented instruction Libraries
  • DUT Map
  • Very Rapid Application Development
  • Test Result Analyzer
  • Shmoo Plot
  • Easy to run. Easy to monitor. Easy to maintain.
Application Fields
SPEA MEMS Test

MEMS

SoC's

Power

PMIC

Automotive

Lighting

Identification

Medical

Design & Code by dsweb.lab
Information Request