Turin (Italy)

March 28, 2024

Join SPEA at IPC APEX EXPO 2024

SPEA Attends IPC APEX EXPO 2024

 

At APEX 2024, the largest annual gathering of electronics manufacturing professionals in North America, SPEA will exhibit at booth #1820 on April 9 – 11, 2024 its top-of-the-range equipment, fully conceived to support electronics manufacturers in eliminating the risk of field failures and saving on the cost of testing.

 

T100BT – Flying head architecture for fast and accurate testing of battery cells and modules

 

Addressing the challenges in battery testing, SPEA has designed an innovative automatic battery test equipment that meets throughput, accuracy and flexibility requirements.

The T100BT Automatic Battery Tester is able to combine, on a single test platform, all the tests required to detect any possible defect on battery cells and modules from cell wiring, to geometrical or surface irregularities, to out-of-specs performances. 

The battery tester is designed for the high-volume production test as well in a Lab/NPI version for engineering, prototypes and low-volume battery testing. The complete configurability allows you to equip the tester with the modules and tools you need to test your products, reaching the desired throughput.

 

T100L – Flying Scanner Tester offering pixel-by-pixel measurement of the most advanced LED device technologies

 

The T100L is a fully automatic Flying Scanner LED Light Tester that helps manufacturers ensure the highest quality of their lighting devices in high-volume production across a wide range of LED products.

Typically, the testing of LED products is done manually by an operator or with test equipment using expensive test fixtures with fiber optics. The variability in light intensity and color temperature in LEDs, together with the sub-assembly functional test process, is one area where process automation can provide a significant return on investment.

The SPEA’s T100L ensures operator-less, consistent, and repeatable test capabilities and offers the highest measurement accuracy at the fastest speed. Thanks to its unique Flying Light Scanner, the tester can acquire a light image of the device surface by scanning all the LEDs in parallel, regardless of the number, at a rate of 200 mm/s.

All the tests run in real-time, which means that the tester can process and analyze the light characteristics of each LED simultaneously while scanning the device.

 

4080 – The fastest Flying Probe Tester in the world

 
Designed for the most demanding electronics manufacturers to reduce test costs, the SPEA 4080 flying probe tester offers the highest throughput on the market. The double-sided high-speed moving axes, micro-probing accuracy and multi-domain testing approach allow boards manufacturers to ensure zero-failure escape in a wide range of applications.

The 4080 is an automatic Flying Probe Tester that can mount 28 different flying tools, chosen among over 50 ones. The combination of electrical test, optical test, thermal test, 3D scan, and many others brings the most comprehensive test coverage. It is suitable to be used for lab certifications, as well as to perform complete, high-throughput production tests also on the most advanced and miniaturized assemblies.

 

T300 – The unique In-Circuit Tester capable to test and flash in parallel up to 32 PCBA

 

The SPEA’s T300 Board Tester is an unprecedented and unique architecture board test system that embeds multi-tester and multi-core capabilities in one compact, fully automatic test equipment.

The T300 features 8 embedded testers, fully independent and configurable for maximum throughput and test parallelism. It supports up to 32 parallel In-Circuit Test Cores and 256 Flashing/Digital Test Cores, plus additional 8 Asynchronous Flashing/Functional Test Cores.

Thanks to these unique features, the system can test and flash in parallel up to 32 PCBAs or a large number of sections of a single large board. That means a substantial reduction of testing time and cost.

The T300 in-circuit tester ensures full test coverage by providing different test techniques (e.g. ICT, Digital & Analog Functional Tests, Flashing, Power Test, etc.) and zero stress on the PCB thanks to the homogeneous planar descent of the motorized presser.. 

 

Artificial Intelligence (AI) applied to SPEA ATE shapes the future of electronic products testing

 

Artificial Intelligence (AI) is the growing technology that is opening up new ways to detect defects and deliver higher quality products with increased efficiency.

SPEA is setting a new milestone in defect detection bringing the power of AI to the testing of electronic products.

The use of deep learning models applied to automatic testers for the identification of unexpected conditions that might cause field failures, or to perform reverse engineering when CAD files are not available, make testing faster and more accurate. 
 
Visit Booth #1820 on April 9 – 11, 2024 and talk with our experts about the best SPEA product to meet your testing needs.

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