ID device
wafer tester

NFC, CPU, memory, RFID devices WAFER TEST

Key features


  • up to 416 devices tested in parallel
  • contact, contactless, dual-interface, NFC
  • custom protocols supported
  • parametric and functional test
  • smart card device family suite editor

The highest multisite in a zero-footprint tester


CT3000 testers can test up to 416 synchronous or asynchronous devices in parallel, offering the highest pin count in testing RFID devices at wafer level (256 devices in parallel).

The system is docked to the wafer prober with hinge manipulator, offering a true zero-footprint solution together with the benefit of a direct, cable-less connection between the test resources and the device under test: best signal integrity is always guaranteed.

Asynchronous dedicated resources per device under test allows for true asynchronous test, with static or dynamic measurement per die.


CT3000 RFID channels can perform, in parallel, extremely accurate and reliable measurements of impedance, retro modulation index, FDT time.

The channels perform the real time encoding and decoding of the communication protocol for the device under test.

Each channel is also equipped with a Controller, to decode in true parallel the communication protocol of the device under test, thus performing complete functional testing of the internal module structure.

The channels are equipped with dedicated CPUs, which permits a full programmability for testing customized protocols.

Test Frequency range is 125kHz to 15MHz (LF/HF).

Ready to test all your smart card modules

CT3000 testers are open and configurable to test any kind of communication protocols used on smart cards, and to be updated for new technologies.

The systems can test devices based on the common standard protocols (as ISO 18000, EPC Global Gen 2, ISO 14443, ISO 15693, MIFARE™, DESFIRE™, FeliCa™, ISO 11784/85, ICode™, Hitag™, ISO 7816), while they can perform functionality verifications also by using customized protocols, completely defined by the device manufacturer.

Short test time for ultra accurate measurement

CT3000’s latest-technology analog instrumentation combines test time reduction with extremely accurate measurements.

The DVM units are capable of data treatment and mathematical calculations on the acquired values. This ensures accurate measurements with no compromise in the data exchange either for single site or multi-site parallel measurements.

Test Capabilities

  • Open/Short/Leakage preliminary tests
  • Impedance measurement
  • Test of passive devices
  • Single commands or command conditioning for RFID devices
  • Signal clearness and strength

Test program generation & debug <1day


  • Easy to Use & Powerful Software
  • RFID signal shape drawing
  • Signal viewer and data analyzer
  • Smart card test function library
  • Software for debugging
  • Software for production

Dual Interface

Smart Card



Design & Code by dsweb.lab